Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
Electron Microscopy Sciences Reference Stage Graticule 75 mmx25 mm Slide
High precision image analysis standard provides four test areas for calibrating image analysis systems and identifying deviations and distortions in optical imaging systems. It is produced on a 75 mm x 25 mm slide and has a square grid accuracy of +/-0.1um and a dot accuracy of +/-0.3um.
The four test areas are:
400 um x 400 um square grid subdivided into 200, 100, 50 and 25 micron squares for detecting gross image distortions and can be used as an accurate two dimensional stage micrometer.
A 20 x 17 array of nominally 15 um diameter dots is used to identify lens distortions.
A root-2 array of spots from 3 um to 48 um diameter is used for determining the threshold levels of cameras and microscopes.
A log-normal distribution array of 100 spots ranging from 4.5 um to 27 um diameter enables the mean and standard deviation to be determined and compared with certified values. This is an idealized distribution of maximum dynamic range for a full screen.
Electron Microscopy Sciences SEM Sample Holder 3 Pin Holder, Flat Base, 25 mm dia x 10 mm H
Our scanning electron microscope specimen holders are designed to improve your productivity and allow you to view more than one sample at a time. You will save pump down time, keep your chamber cleaner and get more work done. All mounts are machined from solid aluminum and come with spring clips/or setscrews to hold your specimens securely. All mounts are made to fit onto your stage and are designed to fit through all standard specimen exchange ports, and have a center-threaded port to accept the Adapter Pins.
All adapters have a threaded portion 5 mm in length. For 1/2" dia. (12.5mm) surface, 1/8" dia. (3.1 mm) pins. Accommodates 3.
Electron Microscopy Sciences Amray 1000/1200/1400 Pin Stub 1/2" head, Aluminum polished, 1/8" Pin diameter
Scanning electron microscope specimen mounts for AMRAY 1000/1200/1400 SEMs. Made from ultra-pure aluminum polished finish with a smooth and luster surface.
Head: 1/2"
Pin diameter: 1/8"
Electron Microscopy Sciences TEM Screen Recoating Hitachi Hs9, Hu11, H600 Inner Main
For optimum viewing, fluorescent screens should be recoated regularly. Viewing screens are easily damaged by the electron beam, especially at high accelerating voltages where knock-on damage can be severe. A proprietary process where 1 to 2 micron particles of phosphor are deposited on the screen and produce the highest possible resolution.
Electron Microscopy Sciences Omniprobe Lift-Out Grids for in-situ FIB, Molybdenum
Custom copper lift-out grids specifically designed for in-situ lift-out. These grids include multiple indexed mounting locations with both vertical bars and "V" shaped attachment surfaces. 3 mm diameter
Material: Molybdenum
DSC Optical Services Inc MICROSCOPE 21V150W EKE BULB
This item has a minimum order quantity of 3 per supplier requirements. MICROSCOPE 21V150W EKE BULB
Electron Microscopy Sciences SEM Very High Resolution Gold on Carbon Test Specimen, JEOL Stub
For very high resolution performance testing this specimen has a smaller gold particle size ranging from 2 nm to 30 nm as compared to the high resolution test above. Ideal for testing at instrument magnifications of 50,000x and above.
Mount: JEOL Stub
Electron Microscopy Sciences Walton & Beckett Graticule G25, 16 mm,
The Walton and Beckett graticule is for counting fibrous dust (asbestos or glass fibers) and particularly where the majority of fibers to be counted are shorter than 5 microns. The circle is divided into four by two diametrical lines scaled in units of 5 and 3 microns respectively. 3 and 5 microns are the critical measurements of fiber lengths and diameters used in fiber counting. Walton and Beckett include shapes with an aspect ratio of 3:1 or 5:1 for comparing to fibers.
IMPORTANT NOTE: The circle on these Walton & Beckett graticules must represent 100 microns at the stage and each one must be manufactured to the individual instrument. Based on the G22. The G25 is produced by the Institute of Occupational Health.
Size: 16 mm
Electron Microscopy Sciences Thin Sample Holder, 8 mm Pin
Ideal for examination cross section of thin samples, such as wafers, multi-layer of capacitors, plastics, metals, etc. For most AMRAY: 1/2" diameter (12.7mm), 1/8" (3.1mm)dia. Pin (3.1mm) with split openings up to 1/4" (6.4mm), with 8mm (5/16") pin height
Electron Microscopy Sciences TEM Screen Recoating Phillips Main Large
For optimum viewing, fluorescent screens should be recoated regularly. Viewing screens are easily damaged by the electron beam, especially at high accelerating voltages where knock-on damage can be severe. A proprietary process where 1 to 2 micron particles of phosphor are deposited on the screen and produce the highest possible resolution.
Electron Microscopy Sciences SEM Ultra High Resolution Gold on Carbon Test Specimen, JEOL Stub
With gold particles ranging from <1 nm to 20 nm, this test is suitable for ultra high resolution SEM tests such as field emission electron source. A magnification of at least 80,000x is required for this test.
Mount: JEOL Stub
Electron Microscopy Sciences Walton & Beckett Graticule G22, 16 mm, 3:1 ratio
The Walton and Beckett graticule is for counting fibrous dust (asbestos or glass fibers) and particularly where the majority of fibers to be counted are shorter than 5 microns. The circle is divided into four by two diametrical lines scaled in units of 5 and 3 microns respectively. 3 and 5 microns are the critical measurements of fiber lengths and diameters used in fiber counting. Walton and Beckett include shapes with an aspect ratio of 3:1 or 5:1 for comparing to fibers.
IMPORTANT NOTE: The circle on these Walton & Beckett graticules must represent 100 microns at the stage and each one must be manufactured to the individual instrument. 3:1 ratio is useful where the majority of fibers to be counted are shorter than 5 um.
Size: 16 mm